Verigy’s HSM3G high-speed memory test solution offers low cost of test for DDR3, DDR4 and beyond

SEMICON West 2010, CUPERTINO, USA: Further extending the testing capabilities of its V93000 HSM platform for the DDR3 generation of mainstream memory ICs and beyond, Verigy has introduced its new HSM3G high-speed memory test solution.

The V93000 HSM3G’s unique advantage is its future-ready upgradeability, enabling it to deliver low cost of test for the next three generations of DDR memories with data-transfer rates up to 6.8 Gbps for unprecedented long-term test economics.

Verigy will demonstrate its new memory test card technology in booth #5847 in North Hall at the SEMICON West trade show, July 13-15 in San Francisco, Calif.

“Memory manufacturers are seeking an economical ATE solution that not only meets their productivity and functionality needs, but also provides longer lifetime value and investment protection beyond a single device generation,” said Hans-Juergen Wagner, vice president of SOC test at Verigy.

“Our scalable V93000 HSM test platform achieves an unprecedented lifetime that delivers outstanding return on investment over at least three device generations, from DDR3 to DDR4 to future generations of mainstream DRAM. These test economics are literally unmatched anywhere else in the industry.”

The V93000 HSM3G is future-ready in terms of speed and functionality, offering the most complete feature set available in the high-speed memory test market. Its programmable, at-speed APG per-pin with support for data bus inversion (DBI) and cyclic redundancy check (CRC) data generation enables testing of advanced DDR4 memory technology features, ensuring high test quality and yield.

Due to its memory ATE per-pin throughput, the V93000 HSM3G provides test-time savings of up to 20 percent. It delivers fully parallel pattern execution, fully parallel DC tests and eye-width measurements, which provides high multi-site efficiency.

The V93000 HSM3G achieves a native 2.9 Gbps data rate and true 256-site DDR3 parallel testing over the entire speed range without any test-time overhead or compromises to accuracy, functionality, test coverage and yield.

Due to its native speed headroom, the HSM3G addresses all mainstream DDR3 speed bins as well as high-end gamer DDR3 and the first two DDR4 volume speed grades. The V93000 platform architecture assures upgradeability to even higher speed devices in the future.